TY - CHAP A1 - Masashi Arita A2 - Kouichi Hamada A3 - Yasuo Takahashi A4 - Kazuhisa Sueoka and Tamaki Shibayama ED1 - Khan Maaz Y1 - 2015-09-02 PY - 2015 T1 - In Situ Transmission Electron Microscopy for Electronics N2 - This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics. BT - The Transmission Electron Microscope SP - Ch. 2 UR - https://doi.org/10.5772/60651 DO - 10.5772/60651 SN - PB - IntechOpen CY - Rijeka Y2 - 2020-08-12 ER -