@incollection{Argunova12, author = {T. S. Argunova and M. Yu. Gutkin and J. H. Je and V. G. Kohn and E. N. Mokhov}, title = {Characterization of Defects Evolution in Bulk SiC by Synchrotron X-Ray Imaging}, booktitle = {Physics and Technology of Silicon Carbide Devices}, publisher = {IntechOpen}, address = {Rijeka}, year = {2012}, editor = {Yasuto Hijikata}, chapter = {2}, doi = {10.5772/52058}, url = {https://doi.org/10.5772/52058} }